, Google Scholar CrossrefĪtom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy,” Nanotechnologyġ6, 3029– 3034 (2005). , Google Scholar CrossrefĬhemical identification of individual surface atoms by atomic force microscopy,” NatureĤ46, 64– 67 (2007). , Google Scholar CrossrefĬomplex patterning by vertical interchange atom manipulation using atomic force microscopy,” Scienceģ22, 413– 417 (2008). , Google Scholar Crossrefĭiffusion of hydrogen on the Si(001) surface investigated by STM atom tracking,” Phys. Linear and nonlinear behavior of piezoelectric materials,” Proc. Nonlinearity effects reduction of an AFM piezoelectric tube scanner using MIMO MPC,” IEEE/ASME Trans. The ReactorSTM: Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions,” Rev. We apply our method to study the movement of pairs of tin atoms confined within a half-unit cell of the Si(111)-(7 × 7) surface and estimate the energy barrier for their diffusion at room temperature. We demonstrate our fully automatic implementation by continuously imaging the same area of a Si(100) surface at the atomic scale with scanning probe microscopy over a period of 25 h at room temperature, showing that the method is robust even under the presence of non-linear drift or spontaneous changes of the probe apex. The protocol also applies selection rules that enable it to withstand significant changes in image contrast. The algorithm extracts and matches pairs of feature points from consecutive images to compute and compensate for probe–sample misalignments over time. The method is based on computer vision techniques and hence applicable to any microscope that generates images through a computer interface. An implementation of drift compensation for imaging at the nanoscale is presented.

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